{"product_id":"digital-integrated-circuit-testing-from-a-quality-perspective-hardcover","title":"Digital Integrated Circuit Testing from a Quality Perspective - Hardcover","description":"\u003cdiv\u003e\u003cp style=\"text-align: right;\"\u003e\u003ca href=\"https:\/\/reportcopyrightinfringement.com\/\" target=\"_blank\" rel=\"nofollow\"\u003e\u003cb\u003eReport copyright infringement\u003c\/b\u003e\u003c\/a\u003e\u003c\/p\u003e\u003c\/div\u003e\u003cp\u003eby \u003cb\u003eEugene R. Hnatek\u003c\/b\u003e (Author)\u003c\/p\u003e\u003cp\u003eApplies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a\u003c\/p\u003e\n            \u003cdiv\u003e\n\u003cstrong\u003eNumber of Pages:\u003c\/strong\u003e 180\u003c\/div\u003e\n            \u003cdiv\u003e\n\u003cstrong\u003eDimensions:\u003c\/strong\u003e 0.65 x 9.72 x 6.24 IN\u003c\/div\u003e\n            \u003cdiv\u003e\n\u003cstrong\u003eIllustrated:\u003c\/strong\u003e Yes\u003c\/div\u003e\n            \u003cdiv\u003e\n\u003cstrong\u003ePublication Date:\u003c\/strong\u003e August 31, 1993\u003c\/div\u003e\n            ","brand":"BooksCloud","offers":[{"title":"Default Title","offer_id":45907889160389,"sku":"9780442006433","price":178.18,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0757\/6718\/5605\/files\/QUJ4VlA3eHpSRXhpTENQYzNoSEZQZz09.webp?v=1772009873","url":"https:\/\/selloorium.com\/products\/digital-integrated-circuit-testing-from-a-quality-perspective-hardcover","provider":"Selloorium","version":"1.0","type":"link"}