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Home Migration Imaging of the Transient Electromagnetic Method - Hardcover
Migration Imaging of the Transient Electromagnetic Method
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Migration Imaging of the Transient Electromagnetic Method - Hardcover

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SKU 9789811027079
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by Xiu Li (Author), Guoqiang Xue (Author), Changchun Yin (Author)

This book is based on more than a decade of research the authors have pursued on the pseudo-seismic migration imaging of the transient electromagnetic method, and provides a series of important findings on the theory and applications in this area. It present and analyzes transforming principles, TEM wave field methods, characteristics of the TEM virtual wave field and studies on many significant related technologies. The coverage is supplemented by a wealth of 1-D, 2-D and 3-D figures to illustrate pseudo-seismic theory. The book offers a valuable resource for teachers, students, researchers and engineers in the fields of geophysics, earth exploration and information technology.

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This book is based on more than a decade of research the authors have pursued on the pseudo-seismic migration imaging of the transient electromagnetic method, and provides a series of important findings on the theory and applications in this area. It present and analyzes transforming principles, TEM wave field methods, characteristics of the TEM virtual wave field and studies on many significant related technologies. The coverage is supplemented by a wealth of 1-D, 2-D and 3-D figures to illustrate pseudo-seismic theory. The book offers a valuable resource for teachers, students, researchers and engineers in the fields of geophysics, earth exploration and information technology.

Author Biography

Xiu Li is a professor in Chang'an University. He is a committee member of the Electromagnetic Committee of Chinese Geophysical Society and chairman of the Committee of Shaanxi Geophysical Society and he is also the director of 6th and 7th council of Chinese Geophysical Society.

Guoqiang Xue is a reseacher in Institute of Geology and Geophysics, Chinese Academy of Sciences. Moreover, he is standing committee of International Technology Committee of Chinese Geophysical Society and standing vice secretary-general of Engineering Geophysics of Chinese Geophysical Society. He is also editor of the Journal of Geophysics & Remote Sensing, Journal of Geology & Geoscience Sensing, Applied Geophysics and Progress of Geophysics.

Number of Pages: 139
Dimensions: 0.38 x 9.21 x 6.14 IN
Illustrated: Yes
Publication Date: October 24, 2016

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