Additional information
by N. Unnikrishnan Nair (Author), S. M. Sunoj (Author), G. Rajesh (Author)
The book deals with the application of various measures of information like the entropy, divergence, inaccuracy, etc. in modelling lifetimes of devices or equipment in reliability analysis.
Author Biography
N. Unnikrishnan Nair gained his Ph.D from the University of Kerala, India and was conferred the degree of Doctor of Humane Letters by Juniata College, USA. He is a Fellow of the Indian Society for Probability and Statistics and its past President. He was also a member of the International Statistical Institute. Nair was the Professor and Chair of the Department of Statistics of the Cochin University of Science and Technology, India, and Dean, Faculty of Science. He also served the University as its Vice Chancellor. He has published six books of which he is the leading author of two recent titles, Quantile-based Reliability Analysis by Birkhauser and Reliability Modeling and Analysis in Discrete Time by Academic Press. He has published over 170 papers in refereed international journals.
S.M. Sunoj gained his Ph.D from the Cochin University of Science and Technology, India. He is the Professor of Department of Statistics, Cochin University of Science and Technology. He has published over 65 papers in refereed international journals. He is an elected member of the International Statistical Institute. He is currently the Associate Editor of the Journal of the Indian Society for Probability and Statistics, India. His areas of research include distribution theory, reliability theory and information measures.
G. Rajesh is the Professor of the Department of Statistics, Cochin University of Science and Technology, India. He received his Ph.D from the Department of Statistics, Cochin University of Science and Technology, India. His main areas of research include distribution theory, information measures and non-parametric inferences. He has published more than 50 research papers in refereed international journals.
