{"product_id":"semiconductor-strain-metrology-principles-and-applications-paperback-3","title":"Semiconductor Strain Metrology: Principles and Applications - Paperback","description":"\u003cdiv\u003e\u003cp style=\"text-align: right;\"\u003e\u003ca href=\"https:\/\/reportcopyrightinfringement.com\/\" target=\"_blank\" rel=\"nofollow\"\u003e\u003cb\u003eReport copyright infringement\u003c\/b\u003e\u003c\/a\u003e\u003c\/p\u003e\u003c\/div\u003e\u003cp\u003eby \u003cb\u003eTerence K. S. Wong\u003c\/b\u003e (Author)\u003c\/p\u003e\u003cp\u003eThis book surveys the major and newly developed techniques for semiconductor strain metrology. Semiconductor strain metrology has emerged in recent years as a topic of great interest to researchers involved in thin film and nanoscale device characterization. This book employs a tutorial approach to explain the principles and applications of each technique specifically tailored for graduate students and postdoctoral researchers. Selected topics include optical, electron beam, ion beam and synchrotron x-ray techniques. Unlike earlier references, this book specifically discusses strain metrology as applied to semiconductor devices with both depth and focus.\u003c\/p\u003e\n            \u003cdiv\u003e\n\u003cstrong\u003eNumber of Pages:\u003c\/strong\u003e 144\u003c\/div\u003e\n            \u003cdiv\u003e\n\u003cstrong\u003eDimensions:\u003c\/strong\u003e 0.37 x 11 x 8.5 IN\u003c\/div\u003e\n            \u003cdiv\u003e\n\u003cstrong\u003ePublication Date:\u003c\/strong\u003e February 01, 2018\u003c\/div\u003e\n            ","brand":"BooksCloud","offers":[{"title":"Default Title","offer_id":45883990311109,"sku":"9781608055548","price":144.45,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0757\/6718\/5605\/files\/ancrdEpwUzAxdE0ySE5seDNteHhYUT09_7b362eca-b8cd-4b87-8117-503100619a39.webp?v=1771823743","url":"https:\/\/selloorium.com\/products\/semiconductor-strain-metrology-principles-and-applications-paperback-3","provider":"Selloorium","version":"1.0","type":"link"}