Additional information
by Juergen Alt (Author)
This book is designed for individuals working in the semiconductor industry who need a fundamental understanding of Design-for-Test (DfT) methods. It caters to test and product engineers who typically utilize these methods, as well as chip designers, project managers, and business owners who seek to comprehend the value of implemented DfT methods. Additionally, it serves as a starting point for beginners in DfT before delving deeper into implementation tools and test pattern generation tasks. Originating from a university lecture, the core content of this book has expanded over the years. It bridges the gap between theoretical textbook descriptions of DfT and its practical application in the industry. The goal is to present DfT as a collection of methods that maintain manufacturing test costs at a level that allows for reasonable selling prices, even for complex products utilizing the latest silicon technologies. The book is structured into three parts: - The first part provides a summary of DfT techniques and an introduction to pattern generation techniques. - The second part delves into established DfT techniques for special analogmixed signal circuits and memories within the industry. - The third part proposes a systematic approach to test concept engineering, maximizing the benefits of DfT methodologies. By exploring the fundamentals and advanced concepts of DfT, this book aims to equip readers with the knowledge and tools necessary to contribute to the ongoing innovation in semiconductor testing and development.
